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Proceedings Paper

Spatially Multiplexed Optical Correlation For Displacement Mapping In Speckle Metrology
Author(s): Klaus Hinsch; Wolfgang Arnold
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Paper Abstract

Optical interrogation of double exposure records in speckle metrology or particle image velocimetry is extended beyond the commonly applied generation of Young's diffraction fringes. The combination of two step optical processing (to produce autocorrelation functions) with spatial multiplexing (to generate a whole field of such functions in parallel) presents a purely optical alternative to digital electronic processing. Special concepts are proposed to evaluate records directly as to statistical parameters or to facilitate screening procedures on large sets of records.

Paper Details

Date Published: 26 October 1989
PDF: 8 pages
Proc. SPIE 1136, Holographic Optics II: Principles and Applications, (26 October 1989); doi: 10.1117/12.961704
Show Author Affiliations
Klaus Hinsch, University of Oldenburg (Germany)
Wolfgang Arnold, University of Oldenburg (Germany)


Published in SPIE Proceedings Vol. 1136:
Holographic Optics II: Principles and Applications

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