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Proceedings Paper

A Comparison Of Real-Time Optical Correlators For Pattern Recognition
Author(s): K. Terry Stalker; Perry A. Molley; Bruce D. Hansche
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Paper Abstract

Two types of optical correlators have been built to investigate real-time pattern recognition. The first employs one-dimensional devices to perform the two dimensional correlation in real time. This architecture uses an array of light emitting diodes (LED's) to input an electronically stored reference image into the processor in parallel. The input scene data is introduced into the processor one line at a time using an acousto-optic device (AOD). Multichannel time integrating correlations are performed in the row direction using the AOD and in the column direction using a charge coupled device (CCD) operating in the time delay and integrate mode. A processor has been built using this technology which correlates a 64 x 44 pixel binary reference image with a 256 x 232 input scene at video rates. The second correlator is a space integrating Fourier transform based correlator. A magneto optic-device (MOD) is used at the Fourier transform plane to rapidly change filter functions. The binary nature of the MOD device necessitates using either a binary phase or binary amplitude representation of the desired complex filter function. For this reason, several types of Binary Phase-Only Filter (BPOF) representations have been analyzed and experimentally investigated. Experimental correlation results have been obtained using both the Hartley BPOF and a newly developed class of complex binary filters, called Quad-Phase-Only Filters (QPOF). The performance of the two systems will be compared on the basis of processing speed, space bandwidth product, processor size and light efficiency. The inherent differences between incoherent and coherent processing and their implications for filter design will also be discussed. Finally, estimates of future performance will be presented.

Paper Details

Date Published: 25 October 1989
PDF: 14 pages
Proc. SPIE 1134, Optical Pattern Recognition II, (25 October 1989); doi: 10.1117/12.961626
Show Author Affiliations
K. Terry Stalker, Sandia National Laboratories (United States)
Perry A. Molley, Sandia National Laboratories (United States)
Bruce D. Hansche, Sandia National Laboratories (United States)

Published in SPIE Proceedings Vol. 1134:
Optical Pattern Recognition II
H. John Caulfield, Editor(s)

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