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Proceedings Paper

Finite-Element Analysis Of Ion-Exchanged Channel Waveguides
Author(s): Guy Lamouche; S. Iraj Najafi
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Paper Abstract

Scalar finite-element method is used to analyze ion-exchanged channel waveguides. First, the accuracy of the calculation is tested by comparing the theoretical prediction and experimental measurement of cut-off wavelengths. Excellent agreement is observed. Then, this method is utilized to study the mode profile of ion-exchanged channel waveguides with a SiO2:TiO2 cover layer. It is shown that waveguides with circular mode profile can be achieved. Finally, the ion-exchanged waveguides with a grating are studied. the effect of grating parameters on waveguide behavior is investigated.

Paper Details

Date Published: 21 December 1989
PDF: 8 pages
Proc. SPIE 1128, Glasses for Optoelectronics, (21 December 1989); doi: 10.1117/12.961446
Show Author Affiliations
Guy Lamouche, Ecole Polytechnique de Montreal (Canada)
S. Iraj Najafi, Ecole Polytechnique de Montreal (Canada)

Published in SPIE Proceedings Vol. 1128:
Glasses for Optoelectronics
Giancarlo C. Righini, Editor(s)

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