Share Email Print
cover

Proceedings Paper

Finite-Element Analysis Of Ion-Exchanged Channel Waveguides
Author(s): Guy Lamouche; S. Iraj Najafi
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Scalar finite-element method is used to analyze ion-exchanged channel waveguides. First, the accuracy of the calculation is tested by comparing the theoretical prediction and experimental measurement of cut-off wavelengths. Excellent agreement is observed. Then, this method is utilized to study the mode profile of ion-exchanged channel waveguides with a SiO2:TiO2 cover layer. It is shown that waveguides with circular mode profile can be achieved. Finally, the ion-exchanged waveguides with a grating are studied. the effect of grating parameters on waveguide behavior is investigated.

Paper Details

Date Published: 21 December 1989
PDF: 8 pages
Proc. SPIE 1128, Glasses for Optoelectronics, (21 December 1989); doi: 10.1117/12.961446
Show Author Affiliations
Guy Lamouche, Ecole Polytechnique de Montreal (Canada)
S. Iraj Najafi, Ecole Polytechnique de Montreal (Canada)


Published in SPIE Proceedings Vol. 1128:
Glasses for Optoelectronics

© SPIE. Terms of Use
Back to Top