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Proceedings Paper

Refractive Index Profiling Of Ion Exchanged Glass Waveguides By RNF-Measurements
Author(s): D. Jestel; E. Voges
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Paper Abstract

Two-dimensional refractive index profiles of strip waveguides are directly measured by a refractive near-field technique with a precision of Δn=0.001 and a spatial resolution of 0.8 μm. This technique is nondestructive, and requires minimal sample preparation.

Paper Details

Date Published: 21 December 1989
PDF: 3 pages
Proc. SPIE 1128, Glasses for Optoelectronics, (21 December 1989); doi: 10.1117/12.961441
Show Author Affiliations
D. Jestel, Universitat Dortmund (Germany)
E. Voges, Universitat Dortmund (Germany)

Published in SPIE Proceedings Vol. 1128:
Glasses for Optoelectronics
Giancarlo C. Righini, Editor(s)

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