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Proceedings Paper

Characterization Of Insulating Photorefractive Materials
Author(s): Jean P. Zielinger; Mayer Tapiero; Jean G. Gies; Jean C. Launay
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Paper Abstract

Widespread application of photorefractive materials depends to a great extent on the possibility of optimizing the extrinsic optical, electrical and photo-electrical properties which are indeed closely related to crystalline defects and impurities. This paper recalls how deep levels are involved in the figures of merit which characterize the performance of the photorefractive materials. Some fundamental difficulties for characterizing and controlling defects in insulators are reviewed. New opportunities are provided by the recent development of specific thermal and optical spectroscopic methods. The techniques are based on transient photoconductivity and differential optical measurements. The principles of the methods are described shortly. Typical results obtained with Bi12 Ge 020 are presented.

Paper Details

Date Published: 22 December 1989
PDF: 7 pages
Proc. SPIE 1127, Nonlinear Optical Materials II, (22 December 1989); doi: 10.1117/12.961419
Show Author Affiliations
Jean P. Zielinger, Institut de Physique et Chimie des Materiaux de Strasbourg (France)
Mayer Tapiero, Institut de Physique et Chimie des Materiaux de Strasbourg (France)
Jean G. Gies, Institut de Physique et Chimie des Materiaux de Strasbourg (France)
Jean C. Launay, Universite de Bordeaux I (France)

Published in SPIE Proceedings Vol. 1127:
Nonlinear Optical Materials II

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