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Proceedings Paper

Waveguide Grating For Polarization Preprocessing Circuits
Author(s): G. Voirin; F. Gradisnik; O. Parriaux; M. T. Gale; R. E. Kunz; B. J. Curtis; H. W. Lehmann
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Paper Abstract

Periodically corrugated optical waveguides on glass with non-collinear coupling have been investigated both theoretically and experimentally. For a TE or TM polarized guided mode of a planar waveguide obliquely incident on a grating pad, there are four characteristic angles corresponding to the coupling with TE and TM reflected modes fulfilling the Bragg condition. The reflectivity is obtained by solving the coupled mode equations for the non-collinear case. The modelling shows that integrated passive functions such as polarization splitting and interference can be achieved. The polarization interference element uses the property that the coupling coefficients TM-TE and TE-TE are equal at defined incidence angles. Since the angle between the two reflected TE beams is only a few minutes of arc, the two beams can interfere. The waveguides are made by K+ ion exchange in BK7 glass for 3 hours at 380°C. The structure was designed for use at a wavelength of 633 nm and uses a 485 nm period grating which was fabricated by holographic exposure and plasma etching techniques in a 50 nm TiO2 layer e-beam evaporated onto the glass surface. The reflectivity of the grating structure was studied experimentally and compared with theory. The diffraction angles are within 30 " of arc of the predicted angles. The measured reflectivities reached 20 %. The feasibility of realizing an integrated optic preprocessing circuit for polarization interferometry has been demonstrated.

Paper Details

Date Published: 14 December 1989
PDF: 8 pages
Proc. SPIE 1126, Electro-Optic and Magneto-Optic Materials and Applications, (14 December 1989); doi: 10.1117/12.961380
Show Author Affiliations
G. Voirin, CSEM (Switzerland)
F. Gradisnik, CSEM (Switzerland)
PSI c/o Laboratories RCA Ltd (Switzerland)
O. Parriaux, CSEM (Switzerland)
M. T. Gale, PSI c/o Laboratories RCA Ltd (Switzerland)
R. E. Kunz, PSI c/o Laboratories RCA Ltd (Switzerland)
B. J. Curtis, PSI c/o Laboratories RCA Ltd (Switzerland)
H. W. Lehmann, PSI c/o Laboratories RCA Ltd (Switzerland)


Published in SPIE Proceedings Vol. 1126:
Electro-Optic and Magneto-Optic Materials and Applications

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