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Proceedings Paper

Bichromatic Interferometry Applied To Precise Adjusting The Wollaston Prism Of A Birefringent Microinterferometer
Author(s): Maksymilian Pluta
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Paper Abstract

Some double refracting microinterferorneters available commercially suffer from a variable interfringe spacing across the image plane. This defect is especially produced by typical birefringent Wollaston prisms and is responsible for some errors in the measurement of optical path differences or related quantities. In particular, the errors arise when the interfringe spacing is directly measured in the image plane of the microinterferometer or determined from an interferogram recorded on a photographic material. To overcome this defect, the Wollaston prism must be adjusted so to obtain a uniform distribution of interference fringes in the image plane. It has been stated that bichromatic interferometry is a useful tool for precise adjusting the Wollaston prism of double refracting microinterferometers.

Paper Details

Date Published: 3 April 1989
PDF: 6 pages
Proc. SPIE 1121, Interferometry '89, (3 April 1989); doi: 10.1117/12.961297
Show Author Affiliations
Maksymilian Pluta, Central Laboratory of Optics (Poland)

Published in SPIE Proceedings Vol. 1121:
Interferometry '89

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