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Proceedings Paper

Automatic Fringe Pattern Analysis For Moire Interferometry
Author(s): M. Kujawinska; K. Patorski; L. Salbut; J. Wojciak
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Paper Abstract

The paper presents the recent contributions to the automatic fringe pattern analysis by the phase stepping method applied to moire interferometry. Two approaches are considerd. The first one is suitable for analysis of stable fringes directly in the moire interferometry set-up where a polarizing phase shifter is used. The second one is applied while unstable conditions during the experiment are encountered or a transient event is tested. This approach requres recording of an intermediate fringe pattern with carrier frequency and examining it in an additional double-diffraction or "sandwich"-type analyser. The experimental results of the analysis performed in the arrangements mentioned above are presented.

Paper Details

Date Published: 3 April 1989
PDF: 6 pages
Proc. SPIE 1121, Interferometry '89, (3 April 1989); doi: 10.1117/12.961259
Show Author Affiliations
M. Kujawinska, Warsaw University of Technology (Poland)
K. Patorski, Warsaw University of Technology (Poland)
L. Salbut, Warsaw University of Technology (Poland)
J. Wojciak, Warsaw University of Technology (Poland)


Published in SPIE Proceedings Vol. 1121:
Interferometry '89

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