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Proceedings Paper

Invited Paper: Selection Procedures for High Reliability Semiconductor Lasers
Author(s): R. L. Hartman; F. R. Nash; P. J. Anthony
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Paper Abstract

This paper reviews the procedures we developed to select lasers for deployment in high reliability systems. The problem of screening out short-lived lasers with the aging controlled by low thermal activation energy failure mechanisms is analyzed. The rationale for and development of a purge (a set of laser-specific over-stresses) is described. Reliability results using real time device hours and more than 2 years of field use show that these selection procedures work well.

Paper Details

Date Published: 15 May 1986
PDF: 9 pages
Proc. SPIE 0616, Optical Technologies for Communication Satellite Applications, (15 May 1986); doi: 10.1117/12.961062
Show Author Affiliations
R. L. Hartman, AT&T Bell Laboratories (United States)
F. R. Nash, AT&T Bell Laboratories (United States)
P. J. Anthony, AT&T Bell Laboratories (United States)

Published in SPIE Proceedings Vol. 0616:
Optical Technologies for Communication Satellite Applications
Kul B. Bhasin, Editor(s)

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