Share Email Print
cover

Proceedings Paper

Measurement Of The Refractive-Index Structure Parameter By Incoherent Aperture Scintillation Techniques
Author(s): Gerard R. Ochs
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The current status of large aperture scintillation techniques for refractive index structure parameter measurement is reviewed, instrument design considerations and limitations are discussed, and a new incoherent aperture profiling system is described.

Paper Details

Date Published: 11 October 1989
PDF: 9 pages
Proc. SPIE 1115, Propagation Engineering, (11 October 1989); doi: 10.1117/12.960863
Show Author Affiliations
Gerard R. Ochs, NOAA/ERL/Wave Propagation Laboratory (United States)


Published in SPIE Proceedings Vol. 1115:
Propagation Engineering
Norman S. Kopeika; Walter B. Miller, Editor(s)

© SPIE. Terms of Use
Back to Top