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Proceedings Paper

Measurement Of The Refractive-Index Structure Parameter By Incoherent Aperture Scintillation Techniques
Author(s): Gerard R. Ochs
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Paper Abstract

The current status of large aperture scintillation techniques for refractive index structure parameter measurement is reviewed, instrument design considerations and limitations are discussed, and a new incoherent aperture profiling system is described.

Paper Details

Date Published: 11 October 1989
PDF: 9 pages
Proc. SPIE 1115, Propagation Engineering, (11 October 1989); doi: 10.1117/12.960863
Show Author Affiliations
Gerard R. Ochs, NOAA/ERL/Wave Propagation Laboratory (United States)

Published in SPIE Proceedings Vol. 1115:
Propagation Engineering
Norman S. Kopeika; Walter B. Miller, Editor(s)

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