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Proceedings Paper

Novel Concept Of Scene Generation And Comprehensive Dynamic Sensor Test
Author(s): Rudolf H. Meier
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Paper Abstract

A method has been developed for comprehensive end-to-end tests of scanning optical sensor systems, including the determination of their line of sight relative to a basic inertial reference frame and of their ability to process data obtained from optical stimuli originating from tactical scenarios.

Paper Details

Date Published: 20 September 1989
PDF: 8 pages
Proc. SPIE 1110, Imaging Infrared: Scene Simulation, Modeling, and Real Image Tracking, (20 September 1989); doi: 10.1117/12.960755
Show Author Affiliations
Rudolf H. Meier, Rockwell International Corporation (United States)


Published in SPIE Proceedings Vol. 1110:
Imaging Infrared: Scene Simulation, Modeling, and Real Image Tracking
August J. Huber; Milton J. Triplett; James R. Wolverton, Editor(s)

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