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Proceedings Paper

Transmission Measurement Of Optical Components At Cryogenic Temperatures
Author(s): John F. Gerhard
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Paper Abstract

Rockwell International Corporation Metrology, in Anaheim, California, has implemented a unique capability for measuring the transmission of plane optical components at cryogenic temperatures. This capability supports Rockwell's Electro-Optical Center in the manufacturing and testing of short- and long-wave IR detectors designed to operate at low thermal background levels.

Paper Details

Date Published: 20 September 1989
PDF: 11 pages
Proc. SPIE 1110, Imaging Infrared: Scene Simulation, Modeling, and Real Image Tracking, (20 September 1989); doi: 10.1117/12.960739
Show Author Affiliations
John F. Gerhard, Rockwell International Corporation (United States)

Published in SPIE Proceedings Vol. 1110:
Imaging Infrared: Scene Simulation, Modeling, and Real Image Tracking
August J. Huber; Milton J. Triplett; James R. Wolverton, Editor(s)

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