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Proceedings Paper

Characterizations Of The Earth Radiation Budget Experiment (ERBE) Scanning Radiometers
Author(s): Robert B. Lee; Bruce R. Barkstrom; Nesim Halyo; Michael A. Gibson; Lee M. Avis
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Paper Abstract

From the Earth Radiation Budget Satellite (ERBS) and the National Oceanic and Atmospheric Administration NOAA 9 and 10 spacecraft platforms, the NASA Earth Radiation Budget Experiment (ERBE) is making absolute measurements of the incoming solar, shortwave Earth-reflected solar, and longwave Earth-emitted fluxes using scanning and nonscanning radiometers. Each of the three spacecraft platforms carries narrow field-of-view (FOV) scanning shortwave, longwave, and total radiometers which measure the radiation in the broadband spectral regions from 0.2 to 5.0 microns, from 5.0 to 50.0 microns, and from 0.2 to 50.0 microns, respectively. The radiometers' detection sensors are thermistor bolometers, coated with a black paint which has a very high coefficient of absorptance. In a laboratory vacuum environment, the gains of the total and longwave radiometers were characterized with uncertainties approaching 1% using the master reference blackbody (MRBB) which is tied to the international practical temperature scale of 1968. Also in vacuum, the gains of the shortwave radiometers were characterized using a 50.8-cm diameter integrating sphere. The sphere was calibrated absolutely using the total and longwave radiometers as transfer standards from the MRBB. The calibration models and approaches which were used to characterize the output signals of the scanning radiometers are described in this paper. Brief descriptions of the scanners and flight calibration systems are presented.

Paper Details

Date Published: 26 September 1989
PDF: 9 pages
Proc. SPIE 1109, Optical Radiation Measurements II, (26 September 1989); doi: 10.1117/12.960721
Show Author Affiliations
Robert B. Lee, NASA Langley Research Center (United States)
Bruce R. Barkstrom, NASA Langley Research Center (United States)
Nesim Halyo, Information & Control Systems, Inc. (United States)
Michael A. Gibson, S T Systems Corporation (United States)
Lee M. Avis, NASA Langley Research Center (United States)


Published in SPIE Proceedings Vol. 1109:
Optical Radiation Measurements II
James M. Palmer, Editor(s)

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