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Proceedings Paper

New Instrumentation For Measuring Spectral Goniometric Reflectance
Author(s): Bruce S. David; Deborah L. Griffith; David W. Allen
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Paper Abstract

The development of a computer-controlled system which enables testing both spectrally and goniometrically will be discussed. Built around a multi-purpose spectroradiometer system, the exit optics attachment allows users to test samples by varying both incident and measurement angles. The general spectroradiometer system and the individual attachment will be highlighted. Originally developed for measuring the reflectance of specular samples from 200nm-30μm, this instrument may also be used for other types of spectral measurements, including diffuse reflectance and transmittance. The above measurement areas will be described, incorporating test sample graphs and system performance data.

Paper Details

Date Published: 26 September 1989
PDF: 11 pages
Proc. SPIE 1109, Optical Radiation Measurements II, (26 September 1989); doi: 10.1117/12.960715
Show Author Affiliations
Bruce S. David, Optronic Laboratories, Inc. (United States)
Deborah L. Griffith, Optronic Laboratories, Inc. (United States)
David W. Allen, Optronic Laboratories, Inc. (United States)

Published in SPIE Proceedings Vol. 1109:
Optical Radiation Measurements II
James M. Palmer, Editor(s)

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