Share Email Print
cover

Proceedings Paper

Low Dose Rate Gamma Test Facility
Author(s): John T. Montroy; James M. Willon; John P. Sheppard; Grant C. Albright
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

A low dose rate (3 rad(Si) per sec) radiation test facility of novel design has been constructed. The apparatus is used for radiation testing of infrared detectors and associated readout circuits. Utilizing a one Curie cobalt 60 source, an ionizing event flux approaching 1 x1010cm-2s-1 is achieved. System design, capabilities, and dosimetry are presented. Also, examples of actual test data are given. The uniqueness of the system arises from the fact that the movement of the radioactive source from the lead pig into the test dewar is controlled from outside the lead experiment enclosure ("hut") via a tungsten-alloy control rod which passes through a small hole in the wall of the hut, virtually eliminating operator exposure. Additionally, the cryostat is a continuous-flow type, and the design of the test dewar allows for the cobalt 60 source to remain at room temperature at all times. Radiation testing using this facility is very convenient, and event rates are highly repeatable due to the indexed, lockable source control rod.

Paper Details

Date Published: 25 September 1989
PDF: 10 pages
Proc. SPIE 1108, Test and Evaluation of Infrared Detectors and Arrays, (25 September 1989); doi: 10.1117/12.960697
Show Author Affiliations
John T. Montroy, Hughes Microelectronics Center (United States)
James M. Willon, Hughes Microelectronics Center (United States)
John P. Sheppard, Hughes Microelectronics Center (United States)
Grant C. Albright, Hughes Microelectronics Center (United States)


Published in SPIE Proceedings Vol. 1108:
Test and Evaluation of Infrared Detectors and Arrays
Forney M. Hoke, Editor(s)

© SPIE. Terms of Use
Back to Top