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Proceedings Paper

Low Temperature Dewar For 1 MeV Electron Transient Testing Of Infrared Focal Plane Arrays
Author(s): D. B. Reynolds; E. W. Atkins; D. L. Rawlins
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Paper Abstract

A low infrared background helium dewar has been built to evaluate the response and recovery of infrared focal plane arrays to transient electron bursts with mean source energy of 1.4 MeV. The dewar has thin beryllium windows in the vacuum and helium shields, open areas in the nitrogen shield, and a mount that allows the device under test to be perpendicular to the incident electron beam. Beryllium provides shield support and optical background reduction while minimizing electron energy absorption. Dose rates as high as 1012 Rad(Si)/s can be achieved at the device under test. A Febetron 705 flash x-ray (FXR) generator at Rockwell International is used to produce the electron beam. The dewar was used with the FXR electron beam generator at various dose rates. The dosimetry performed in the dewar/electron beam environment will be discussed, including an analysis of the electron beam energy spectrum at the device position.

Paper Details

Date Published: 25 September 1989
PDF: 8 pages
Proc. SPIE 1108, Test and Evaluation of Infrared Detectors and Arrays, (25 September 1989); doi: 10.1117/12.960693
Show Author Affiliations
D. B. Reynolds, Rockwell International Science Center (United States)
E. W. Atkins, Rockwell International Science Center (United States)
D. L. Rawlins, Rockwell International Science Center (United States)

Published in SPIE Proceedings Vol. 1108:
Test and Evaluation of Infrared Detectors and Arrays
Forney M. Hoke, Editor(s)

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