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Proceedings Paper

Test System For MCT Photoconductor Arrays
Author(s): N. Butler; A. Carson; A. J. Verrilli
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Paper Abstract

The architecture of a versatile, reliable, and expandable automatic test system is described. The system incorporates a low noise computer-like control and address bus into which a number of boards can be inserted. Individual boards have been designed to date to multiplex 16 detector inputs and bias one of them, to bias and multiplex 8 detectors, and to power internal dewar bias networks with a programmable low noise power supply. Test systems built with this architecture have been configured to test arrays of up to 180 elements at measurement frequencies from DC to 5 MHz. Noise levels well under 1 nV per root Hertz, with negligible stray signal contamination, are routinely obtained over the entire frequency range. Design details of individual modules will be described in addition to description of the overall system design and EMI control philosophy.

Paper Details

Date Published: 25 September 1989
PDF: 10 pages
Proc. SPIE 1108, Test and Evaluation of Infrared Detectors and Arrays, (25 September 1989); doi: 10.1117/12.960691
Show Author Affiliations
N. Butler, Honeywell Electro-Optics Division (United States)
A. Carson, Honeywell Electro-Optics Division (United States)
A. J. Verrilli, Honeywell Electro-Optics Division (United States)

Published in SPIE Proceedings Vol. 1108:
Test and Evaluation of Infrared Detectors and Arrays
Forney M. Hoke, Editor(s)

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