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Proceedings Paper

Short And Medium Wavelength PV Detector Test Station
Author(s): N. Butler; A. Carson; A. J. Verrilli; A. Westwick
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Paper Abstract

An automatic detector test system to characterize short and medium wavelength photovoltaic (PV) detectors is described. The system is designed to measure impedances from more than 1012 Ω to less than 100 Ω and to measure noise from source impedances between 104 Ω and 1010 Ω at frequencies from 1 Hz to 100 kHz. The system includes multiplexing to test up to 200 elements mounted in a test dewar. Multiplexing is performed with specialized stepping switches for low series resistance, high isolation resistance and low stray capacitance. State of the art high bandwidth, low noise, current sensitive preamplifiers with seven gain ranges cover the wide range of source resistance. The test dewar temperature can be controlled from 80 K to 300 K with a resolution of 0.01 K. Dual signal measurement channels are included for speed and flexibility. The custom built electronics is in two different types of modules and is controlled by a small computer. Optical baffling is used to reduce stray reflections and increase test accuracy.

Paper Details

Date Published: 25 September 1989
PDF: 7 pages
Proc. SPIE 1108, Test and Evaluation of Infrared Detectors and Arrays, (25 September 1989); doi: 10.1117/12.960688
Show Author Affiliations
N. Butler, Honeywell Electro-Optics Division (United States)
A. Carson, Honeywell Electro-Optics Division (United States)
A. J. Verrilli, Honeywell Electro-Optics Division (United States)
A. Westwick, Honeywell Electro-Optics Division (United States)

Published in SPIE Proceedings Vol. 1108:
Test and Evaluation of Infrared Detectors and Arrays
Forney M. Hoke, Editor(s)

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