Share Email Print
cover

Proceedings Paper

An Approach To A Versatile Focal Plane Array Test Facility
Author(s): C. L. Kauffman; C. R. Costanzo; D. R. Kaplan
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The CECOM Center for Night Vision and Electro-Optics (C2NVEO) infrared nfrared Focal Plane Array test facility is being upgraded to improve speed and test capability. Prior to the upgrade,the test station was capable of testing FPA's, but it did not meet present and future testing needs. Deficiencies such as; high system noise, inflexible dewar configuration, Limited levels of automation, in addition to the inability to perform focussed spot and FPA spectral responsivity measurements were reasons to improve the test station. It was important during this development that the ability to characterize a diverse variety of Infrared (IR) Focal Plane Array designs, sizes, formats, materials, and applications be maintained or increased. Considerations relating to this will be discussed. In the future, the test station will be able to test HgCdTe and PtSi arrays on a much larger scale than at present and test other new technologies as well. The goal is to be able to fully characterize one Focal Plane Array per day.

Paper Details

Date Published: 25 September 1989
PDF: 7 pages
Proc. SPIE 1108, Test and Evaluation of Infrared Detectors and Arrays, (25 September 1989); doi: 10.1117/12.960686
Show Author Affiliations
C. L. Kauffman, U.S. Army CECOM Center for Night Vision and Electro-Optics (United States)
C. R. Costanzo, U.S. Army CECOM Center for Night Vision and Electro-Optics (United States)
D. R. Kaplan, U.S. Army CECOM Center for Night Vision and Electro-Optics (United States)


Published in SPIE Proceedings Vol. 1108:
Test and Evaluation of Infrared Detectors and Arrays
Forney M. Hoke, Editor(s)

© SPIE. Terms of Use
Back to Top