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Proceedings Paper

Automated, Complex Testing Of A 64:1 Readout Multiplexer For Infrared Focal Planes
Author(s): Noel D. Jolivet; Stanley Voynick
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Paper Abstract

A 64-channel readout device with a 64:1 multiplexer output, designed for use in cryogenic, infrared focal plane applications, is being tested extensively in a production environment. For the test system, an existing product was modified and expanded to provide the accuracy, flexibility, and throughput needed to meet test requirements. Unique test approaches, coupled with innovative throughput enhancement techniques, streamlined operations to allow automated testing of 500 devices per day on one test set with minimum operator intervention. The system executes more than 20 sophisticated tests at wafer level, in order to grade each device as faulted or specification-acceptable. Confidence in the quality and reliability of the deliverable product has also been increased. Creative software modules were designed and integrated with a standard software package (developed and refined over 5 years of device testing), forming a test program which fulfills demanding test requirements. These new modules facilitate viewing of raw data, display of "quick-look" reduced data, failure analysis, and re-sorting of device grades after testing. Additional benefits derived from this development effort include automated testing of packaged parts at both ambient and cryogenic temperatures, and reduced characterization test time for similar devices. Anticipated future improvements include greater utilization of the pipeline processor already present in the system architecture, and continued development to generalize the software package to allow swift reconfiguration for testing other readouts and hybrid arrays of varying size and performance.

Paper Details

Date Published: 25 September 1989
PDF: 9 pages
Proc. SPIE 1108, Test and Evaluation of Infrared Detectors and Arrays, (25 September 1989); doi: 10.1117/12.960684
Show Author Affiliations
Noel D. Jolivet, Amber Engineering, Inc. (United States)
Stanley Voynick, Amber Engineering, Inc. (United States)


Published in SPIE Proceedings Vol. 1108:
Test and Evaluation of Infrared Detectors and Arrays
Forney M. Hoke, Editor(s)

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