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Proceedings Paper

Detailed Characterization Of Advanced Technology Focal Plane Arrays
Author(s): S. R. Hawkins; R. P. Farley; A. K. Gressle; C. H. Bazzill; G. W. Hines; S. L. Schlegelmilch; A. H. Hubert
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Paper Abstract

With the development of large high-performance, self-scanned infrared and visible focal plane arrays (FPAs) for military and scientific applications, fairly sophisticated optical apparatus is required and novel computer-aided data acquisition and processing techniques are needed for complete testing and characterization of these devices. For many advanced tactical and strategic applications, the data generated by a single focal plane sensor chip ca n exceed several tens of megapixels per second and the very low noise can result in a dynamic range in excess of 105 at the lower pixel rates. Also, the number of detectors in a single device can range from a few hundred in the case of a simple scanning sensor to a few million in the case of large staring arrays for scientific applications. This paper describes the capabilities developed over the past several years at the Lockheed Palo Alto Research Laboratory for the detailed test and characterization of a broad range of advanced technology focal plane arrays. Hardware and software techniques for the automated measurement and characterization of key FPA performance parameters such as photoresponse, spectral response, noise, detector RA product, frequency response, optical and electrical crosstalk, and spatial response and MTF will be discussed. Specific examples of data will be shown with special emphasis on automated measurement of frequency response, spatial response and MTF, and spectral response.

Paper Details

Date Published: 25 September 1989
PDF: 14 pages
Proc. SPIE 1108, Test and Evaluation of Infrared Detectors and Arrays, (25 September 1989); doi: 10.1117/12.960682
Show Author Affiliations
S. R. Hawkins, Lockheed Palo Alto Research Laboratory (United States)
R. P. Farley, Lockheed Palo Alto Research Laboratory (United States)
A. K. Gressle, Lockheed Palo Alto Research Laboratory (United States)
C. H. Bazzill, Lockheed Palo Alto Research Laboratory (United States)
G. W. Hines, Lockheed Palo Alto Research Laboratory (United States)
S. L. Schlegelmilch, Lockheed Palo Alto Research Laboratory (United States)
A. H. Hubert, RMH Associates (United States)


Published in SPIE Proceedings Vol. 1108:
Test and Evaluation of Infrared Detectors and Arrays
Forney M. Hoke, Editor(s)

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