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Proceedings Paper

Ultra-Low Background Dewar For Infrared Detector Characterization Studies
Author(s): K. M. Hays; D. L. Rawlins; M. D. Petroff; M. G. Stapelbroek
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Paper Abstract

An extremely low background research dewar has been designed, and several have been built and are currently being used for characterization of visible and infrared photon detectors. The dewar has a background in the 106 photons/cm2-s range over our detection capability range of 0.4 to 28 micrometers wavelength. This low background environment facilitates visible and infrared detector experiments involving photon counting, long charge integration times or devices with large surface areas. The temperature of the device under test can be regulated between 4.3 and 20 K. The dewars have been in constant use for several years and have proved to be both flexible and trouble-free. The dewar design incorporates many features that are useful for infrared detector testing and characterization studies in general. Flood illumination of the detector under test can be provided by an internal bandpass-filtered hot resistor source, pinhole shutter, light-emitting diode, optical fiber, or any combination of these sources. The entire test stage is mounted as a plug-in module to accommodate packages with different pin configurations. Calibrated reference detectors are attached to the side of the test detector socket. The leads between the detector test socket and the vacuum feedthroughs are less than 15 centimeters long, to keep corresponding stray capacitances low. The combination of extremely low photon background, flexibility and trouble-free operation results in a dewar that is well-suited for the measurement of sensitive infrared detectors in a research environment.

Paper Details

Date Published: 25 September 1989
PDF: 9 pages
Proc. SPIE 1108, Test and Evaluation of Infrared Detectors and Arrays, (25 September 1989); doi: 10.1117/12.960681
Show Author Affiliations
K. M. Hays, Rockwell International Science Center (United States)
D. L. Rawlins, Rockwell International Science Center (United States)
M. D. Petroff, Rockwell International Science Center (United States)
M. G. Stapelbroek, Rockwell International Science Center (United States)

Published in SPIE Proceedings Vol. 1108:
Test and Evaluation of Infrared Detectors and Arrays
Forney M. Hoke, Editor(s)

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