Share Email Print

Proceedings Paper

SDIO Focal Plane Test Program
Author(s): Anna Trujillo; Lawrence Lloyd
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The improvements in the development of focal plane array technology are greatly impacting the ability to test the arrays. To ease this impact, the Air Force Space Technology Center is coordinating the Focal Plane Test Program. This program consists of 1) a Focal Plane Test Working Group, 2) a Round Robin Test Schedule, and 3) interaction with the users of the focal plane arrays.

Paper Details

Date Published: 25 September 1989
PDF: 11 pages
Proc. SPIE 1108, Test and Evaluation of Infrared Detectors and Arrays, (25 September 1989); doi: 10.1117/12.960677
Show Author Affiliations
Anna Trujillo, Air Force Space Technology Center (United States)
Lawrence Lloyd, Nichols Research Corporation (United States)

Published in SPIE Proceedings Vol. 1108:
Test and Evaluation of Infrared Detectors and Arrays
Forney M. Hoke, Editor(s)

© SPIE. Terms of Use
Back to Top