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Proceedings Paper

Electron Beam Testing Of LWIR Detectors
Author(s): M. E. O'Brien; L. D. Flesner
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Paper Abstract

A scanning electron microscope (SEM) has been modified and conjoined with a cryogenic chamber to enable application of a focused electron beam to probe long-wavelength infrared (LWIR) detectors in a low IR photon environment. A beam blanker installed in the SEM allows the temporal as well as the spatial response of a detector to be measured. The apparatus has been applied to study the effects of ionizing radiation in Si impurity band detectors and HgCdTe detectors. Examples of these applications are presented.

Paper Details

Date Published: 25 September 1989
PDF: 8 pages
Proc. SPIE 1108, Test and Evaluation of Infrared Detectors and Arrays, (25 September 1989); doi: 10.1117/12.960675
Show Author Affiliations
M. E. O'Brien, Naval Ocean Systems Center (United States)
L. D. Flesner, Naval Ocean Systems Center (United States)

Published in SPIE Proceedings Vol. 1108:
Test and Evaluation of Infrared Detectors and Arrays
Forney M. Hoke, Editor(s)

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