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Proceedings Paper

IT CCD Imaging Sensor With Variable Speed Electronic Shutter
Author(s): Kikue Ishikawa; Masaharu Hamasaki; Tomoyuki Suzuki; Hideo Kanbe; Yoshiaki Kagawa; Katsuroh Miyata; Kazuya Yonemoto
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Paper Abstract

The Hole-Accumulation Diode-Sensor (HAD-Sensor) structure, which allows to implement the variable speed electronic shutter in the Interline Transfer (IT) CCD imaging sensor, has been developed. Based on this technology, a 2/3 inch imaging sensor with 420,000 picture elements for consumer, industrial, and professional use was manufactured. The theoretical lower limit of variable shutter speed is about 1/1,000,000 sec. in the case of exposure within the vertical blanking interval (i.e. below 1/787 sec.). This HAD-Sensor achieves the following five major results, which are essential to yield the variable speed electronic shutter in an IT CCD: ( 1 ) complete draining of unwanted stored charges into n-type substrate, ( 2 ) negligibly small lag, ( 3 ) dark current reduced to 1/10 of the conventional level, ( 4 ) smear reduced to 1/5 of the conventional level, and ( 5 ) increased blue sensitivity.

Paper Details

Date Published: 11 October 1989
PDF: 12 pages
Proc. SPIE 1107, Infrared Detectors, Focal Plane Arrays, and Imaging Sensors, (11 October 1989); doi: 10.1117/12.960651
Show Author Affiliations
Kikue Ishikawa, Sony Corporation (Japan)
Masaharu Hamasaki, Sony Corporation (Japan)
Tomoyuki Suzuki, Sony Corporation (Japan)
Hideo Kanbe, Sony Corporation (Japan)
Yoshiaki Kagawa, Sony Corporation (Japan)
Katsuroh Miyata, Sony Corporation (Japan)
Kazuya Yonemoto, Sony Corporation (Japan)

Published in SPIE Proceedings Vol. 1107:
Infrared Detectors, Focal Plane Arrays, and Imaging Sensors
Eustace L. Dereniak; Robert E. Sampson, Editor(s)

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