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Proceedings Paper

Far Infrared Analysis Of The HgTe-CdTe Superlattice
Author(s): S. Perkowitz; L. S. Kim; O. K. Wu; J. N. Schulman
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Paper Abstract

The unusual properties of the HgTe-CdTe superlattice (SL), and its potential as an infrared detector material, make it worth study. Growth of this SL is a complex process so that good characterization is essential. Important structural and electronic properties appear in the region 10-250 cm-1, making far infrared spectroscopy a powerful probe. We show how reflectivity spectra analyzed by a simple, effective theory give Hg content in the nominal CdTe layers, layer thicknesses, effective mass, and the HgTe-CdTe valence band offset. We get m*/m° = 0.010 and 0.022 for dHgTe/dcdTe = 80 Å/40 A, and 0.013 and 0.044 for dHgTe/d CdTe = 64 Å/60 Å, at 78 and 300K respectively. We obtain a valence band offset of 300 meV for the 80 Å/40 Å SL.

Paper Details

Date Published: 12 September 1989
PDF: 8 pages
Proc. SPIE 1106, Future Infrared Detector Materials, (12 September 1989); doi: 10.1117/12.960642
Show Author Affiliations
S. Perkowitz, Emory University (United States)
L. S. Kim, Emory University (United States)
O. K. Wu, Hughes Research Laboratories (United States)
J. N. Schulman, Hughes Research Laboratories (United States)


Published in SPIE Proceedings Vol. 1106:
Future Infrared Detector Materials
Jan W. Baars; Randolph E. Longshore, Editor(s)

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