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Proceedings Paper

Characterization Of GaAs Monolithic Circuits By Optical Techniques
Author(s): H-L. A. Hung; T. T. Lee; P. Polak-Dingels; E. Chauchard; K. Webb; C. H. Lee; H. C. Huang
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Paper Abstract

Optical techniques for broadband microwave signal generation and detection have been developed to characterize monolithic microwave integrated circuits (MMICs). Emphasis is on the enhancement of measurement accuracy and the identification of limitations. De-embedded complex S-parameters are derived from time-domain data obtained from both a GaAs photoconductive switch and electro-optic sampling of a Ka-band MMIC power amplifier. These parameters are directly compared with those measured from a network analyzer of the same circuit.

Paper Details

Date Published: 14 August 1989
PDF: 9 pages
Proc. SPIE 1102, Optical Technology for Microwave Applications IV, (14 August 1989); doi: 10.1117/12.960543
Show Author Affiliations
H-L. A. Hung, COMSAT Laboratories (United States)
T. T. Lee, COMSAT Laboratories (United States)
P. Polak-Dingels, University Research Foundation (United States)
E. Chauchard, University of Maryland (United States)
K. Webb, University of Maryland (United States)
C. H. Lee, University of Maryland (United States)
H. C. Huang, University of Maryland (United States)


Published in SPIE Proceedings Vol. 1102:
Optical Technology for Microwave Applications IV
Shi-Kay Yao, Editor(s)

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