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Proceedings Paper

Background Characterization Techniques For Pattern Recognition Applications
Author(s): Meg A. Noah; Paul V. Noah; John Schroeder; B. V. Kessler; Julian Chernick
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Paper Abstract

The Department of Defense has a requirement to investigate technologies for the detection of air and ground vehicles in a clutter environment. The use of autonomous systems using infrared, visible, and millimeter wave detectors has the potential to meet DOD's needs. In general, however, the hard-ware technology (large detector arrays with high sensitivity) has outpaced the development of processing techniques and software. In a complex background scene the "problem" is as much one of clutter rejection as it is target detection. The work described in this paper has investigated a new, and innovative, methodology for background clutter characterization, target detection and target identification. The approach uses multivariate statistical analysis to evaluate a set of image metrics applied to infrared cloud imagery and terrain clutter scenes. The techniques are applied to two distinct problems: the characterization of atmospheric water vapor cloud scenes for the Navy's Infrared Search and Track (IRST) applications to support the Infrared Modeling Measurement and Analysis Program (IRAMMP); and the detection of ground vehicles for the Army's Autonomous Homing Munitions (AHM) problems. This work was sponsored under two separate Small Business Innovative Research (SBIR) programs by the Naval Surface Warfare Center (NSWC), White Oak MD, and the Army Material Systems Analysis Activity at Aberdeen Proving Ground MD. The software described in this paper will be available from the respective contract technical representatives.

Paper Details

Date Published: 30 August 1989
PDF: 16 pages
Proc. SPIE 1098, Aerospace Pattern Recognition, (30 August 1989); doi: 10.1117/12.960425
Show Author Affiliations
Meg A. Noah, Ontar Corporation (United States)
Paul V. Noah, Ontar Corporation (United States)
John Schroeder, Ontar Corporation (United States)
B. V. Kessler, Naval Surface Warfare Center (United States)
Julian Chernick, Army Material Systems Analysis Activity, APG (United States)

Published in SPIE Proceedings Vol. 1098:
Aerospace Pattern Recognition
Marshall R. Weathersby, Editor(s)

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