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Proceedings Paper

Optical System Design For Automated Thermal Expansion Measurements
Author(s): E. G. Wolff
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Paper Abstract

Thermally induced distortions are of interest for many materials, components and structures used in astronomy, aerospace systems, metrology and the optics industry. Optical interference pattern analysis offers the best hope for precise information on dimensional changes of less than a micron. This paper reviews the various optical approaches to linear thermal expansion measurements. Emphasis is placed on the Michelson interferometer because of its versatility for making contactless measurements in real time and the elimination of sample shape or size constraints. The use of composite materials in optical support structures is a driving force in the utilization of improved optical systems for thermal distor-tion measurements. Auxiliary capabilities therefore include fast response, (e.g., for opto-acoustic emission analysis), long term stability (for creep effects), multi-dimensional changes (holography), automatic control of sample position and computer aided data acquisition and analysis.

Paper Details

Date Published: 16 June 1986
PDF: 7 pages
Proc. SPIE 0613, Nonlinear Optics and Applications, (16 June 1986); doi: 10.1117/12.960414
Show Author Affiliations
E. G. Wolff, The Aerospace Corporation (United States)

Published in SPIE Proceedings Vol. 0613:
Nonlinear Optics and Applications
Pochi Yeh, Editor(s)

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