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Proceedings Paper

Readout Producibility For Z-Technology
Author(s): Robert C. Kline; Noel D. Jolivet; Omkarnath K. Gupta
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Paper Abstract

Production rates of low-noise, cryogenic readout devices have been demonstrated. These devices are being produced under a MIL-Q-9858A quality system and are processed per the requirements of MIL-STD-883C. Performance, testability, reliability and producibility of the design have been equally considered throughout the development cycle. All required processes, test methodologies, and quality assurance procedures have been implemented to support production requirements.

Paper Details

Date Published: 13 September 1989
PDF: 7 pages
Proc. SPIE 1097, Materials, Devices, Techniques, and Applications for Z-Plane Focal Plane Array, (13 September 1989); doi: 10.1117/12.960389
Show Author Affiliations
Robert C. Kline, Amber Engineering, Inc. (United States)
Noel D. Jolivet, Amber Engineering, Inc. (United States)
Omkarnath K. Gupta, Amber Engineering, Inc. (United States)

Published in SPIE Proceedings Vol. 1097:
Materials, Devices, Techniques, and Applications for Z-Plane Focal Plane Array
John C. Carson, Editor(s)

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