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Proceedings Paper

Integrated Optic Wavemeter
Author(s): R. Aaron Falk; Loren E. Laybourn; Donald W. Schultz
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Paper Abstract

The application of the dispersion properties of unequal arm Mach-Zehnder interferometers to an integrated optic wavemeter has been demonstrated. Experimental data yields a measurement accuracy of 1 part in 103. An optimal design could be expected to obtain better than 1 part in 105.

Paper Details

Date Published: 9 February 1989
PDF: 4 pages
Proc. SPIE 0994, Optoelectronic Materials, Devices, Packaging, and Interconnects II, (9 February 1989); doi: 10.1117/12.960135
Show Author Affiliations
R. Aaron Falk, Boeing Aerospace Company (United States)
Loren E. Laybourn, Boeing Aerospace Company (United States)
Donald W. Schultz, Boeing Aerospace Company (United States)

Published in SPIE Proceedings Vol. 0994:
Optoelectronic Materials, Devices, Packaging, and Interconnects II
Glen M. McWright; Henry J. Wojtunik, Editor(s)

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