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Proceedings Paper

Precision Transfer Function Measurements Of Integrated Optical Modulators
Author(s): Mark Lowry; Greg Lancaster; Richard T. Peterson; Glen McWright; Dan Nelson; Bill Kidd
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Paper Abstract

We present transfer function (TF) data from a Crystal Technology , Inc. 2x2 switch modulator. The data was obtained using an in-house designed and built automated measurement system that uses pulsed optical illumination at 840nm and pulsed electrical modulation input, to simulate our actual operating conditions for the device. The precision of the TF system electronics is found to be better than 1% over most of the measurement range and approaching 0.1% at the midrange of the signals. The reproduci-bility of the transfer functions themselves was found to be better than 2.0%. The effects of photorefractive damage on the device transfer function were studied. For optical doses of approximately 12 mJ (device output) at 840 nm the photorefractively induced changes in the 'IF were less than 10%. The effects of temperature on the transfer function were studied over a temperature range of 23 C to 45 C and found to be quite significant for one of three devices measured. For two others the temperature effects were nearly negligible.

Paper Details

Date Published: 9 February 1989
PDF: 7 pages
Proc. SPIE 0994, Optoelectronic Materials, Devices, Packaging, and Interconnects II, (9 February 1989); doi: 10.1117/12.960129
Show Author Affiliations
Mark Lowry, Lawrence Livermore National Laboratory (United States)
Greg Lancaster, Lawrence Livermore National Laboratory (United States)
Richard T. Peterson, Lawrence Livermore National Laboratory (United States)
Glen McWright, Lawrence Livermore National Laboratory (United States)
Dan Nelson, Lawrence Livermore National Laboratory (United States)
Bill Kidd, Lawrence Livermore National Laboratory (United States)


Published in SPIE Proceedings Vol. 0994:
Optoelectronic Materials, Devices, Packaging, and Interconnects II
Glen M. McWright; Henry J. Wojtunik, Editor(s)

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