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Proceedings Paper

MIL-STD-1678, Fiber Optic Test Methods
Author(s): Laura Carlin
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Paper Abstract

Fiber Optics (FO) testing is required to assure reliability and functional operability of the many FO products currently being developed. It is essential to test end product optical performance under a stringent environment which duplicates temperature extremes, mechanical stresses and caustic atmospheric conditions commonly found in military FO applications. The Naval Air Systems Command (NAVAIR) is currently revising MIL-STD-1678, "Fiber Optic Test Methods," to provide a comprehensive set of current and technically accurate Fiber Optic Test Methods (FOTMs) for evaluation of Military systems, subsystems and components. The goal of this revision is to provide a cost effective standard that will ensure commonality throughout Navy, Army, Air Force and National Aeronautics and Space Administration (NASA) FO programs. Also, it will allow design engineers to avoid duplication in testing and it will aid in selecting appropriate test methods. The standard will be organized to provide a basis for the development of an automated tracking and referencing system. This revision will not only meet current needs, but will also be designed such that it can easily grow to accommodate future needs. Highlights of this revision include development of: (1) Guidelines to identify the essential contents of an FOTM, (2) A standard test method format, (3) An intelligent, user friendly FOTM numbering or identification system, (4) A standard laboratory validation process for test methods to ensure both effectiveness and military applicability prior to inclusion in MIL-STD-1678.

Paper Details

Date Published: 26 April 1989
PDF: 4 pages
Proc. SPIE 0992, Fiber Optics Reliability: Benign and Adverse Environments II, (26 April 1989); doi: 10.1117/12.960039
Show Author Affiliations
Laura Carlin, Naval Air Engineering Center (United States)


Published in SPIE Proceedings Vol. 0992:
Fiber Optics Reliability: Benign and Adverse Environments II
Roger A. Greenwell; Dilip K. Paul; Shekhar G. Wadekar, Editor(s)

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