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Proceedings Paper

Microprocessor-Based Charge-Coupled Device (CCD) Test Console
Author(s): E. L. Deraniak; R. A. Bredthauer; E. M. Hicks; J. E. Vicars; R. A. Florence
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Paper Abstract

The integration of a commercially available microprocessor system (Commodore PET 2001) to control test equipment used in CCD array testing is described. The system can be used to determine charge transfer efficiency and noise of a CCD array for preliminary evaluation. The system is interactively controlled by an operator who runs a BASIC program from the keyboard of the microprocessor. Data collection is done by the computer/interface to minimize operator errors. The system is implemented primarily for quick-look quantitative evaluation of arrays being mass produced by industry.

Paper Details

Date Published: 20 July 1981
PDF: 7 pages
Proc. SPIE 0267, Staring Infrared Focal Plane Technology, (20 July 1981); doi: 10.1117/12.959913
Show Author Affiliations
E. L. Deraniak, Rockwell International (United States)
R. A. Bredthauer, Rockwell International (United States)
E. M. Hicks, Rockwell International (United States)
J. E. Vicars, Rockwell International (United States)
R. A. Florence, Rockwell International (United States)


Published in SPIE Proceedings Vol. 0267:
Staring Infrared Focal Plane Technology
David N. Pocock, Editor(s)

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