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Proceedings Paper

Charge-Coupled Device (CCD) Based, Slow-Scan, Integrating Imaging System
Author(s): P. Burstein; J. Bloch; P. Gauthier; D. Harrison; B. Holmes
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Paper Abstract

A CCD-based imaging system has been developed for the White Light Coronagraph/X-Ray XUV Telescope experiment on the International Solar Polar Mission, The flight system supports two separate focal plane CCDs, one of which is an 800 x 800 pixel array for white light detection, the other a 256 x 320 device for the 8-750 Å band. Each CCD has its own dedicated clocking circuitry and preamplifier. Each employs correlated double sampling, Once the output signals are beyond the amplification stages, however, both devices use the same processing hardware. The flight system is controlled by an on-board microprocessor which compresses, formats and buffers the data for acquisition by the telemetry system, A breadboard system which uses a minicomputer as controller and image processor has been assembled and tested, This system has been used to evaluate the sensitivity and imaging characteristics of several CCDs, Sample results of X-ray and XUV illuminations are shown. The minicomputer system supports not only bench testing, but payload integration, checkout and post-launch data and analysis as well. The imaging and data analysis software developed during breadboard testing is incorporated directly into these other program phases.

Paper Details

Date Published: 21 November 1980
PDF: 9 pages
Proc. SPIE 0264, Applications of Digital Image Processing to Astronomy, (21 November 1980); doi: 10.1117/12.959773
Show Author Affiliations
P. Burstein, American Science and Engineering, Inc. (United States)
J. Bloch, American Science and Engineering, Inc. (United States)
P. Gauthier, American Science and Engineering, Inc. (United States)
D. Harrison, American Science and Engineering, Inc. (United States)
B. Holmes, American Science and Engineering, Inc. (United States)


Published in SPIE Proceedings Vol. 0264:
Applications of Digital Image Processing to Astronomy
Denis A. Elliot, Editor(s)

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