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Proceedings Paper

Scattering From Surface Roughness�Implications On X-Ray Imaging
Author(s): R J Noll; P Glenn
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Paper Abstract

Results of an analysis of surface profile measurements by J. Bennett on a set of very smooth flat surfaces is presented. Visible scattering profiles are predicted and compared with measured scatter profiles. The predicted scatter profiles are integrated for compari-son with total integrated scatter measurements (TIS). Using the model analysis at X-ray wavelengths illustrates the impact of various surface profiles on X-ray imaging.

Paper Details

Date Published: 3 March 1981
PDF: 9 pages
Proc. SPIE 0257, Radiation Scattering in Optical Systems, (3 March 1981); doi: 10.1117/12.959618
Show Author Affiliations
R J Noll, The Perkin-Elmer Corporation (United States)
P Glenn, The Perkin-Elmer Corporation (United States)

Published in SPIE Proceedings Vol. 0257:
Radiation Scattering in Optical Systems
Gary H. Hunt, Editor(s)

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