Proceedings Paper
Microprocessor-Based Instrumentation For Bidirectional Reflectance Distribution Function (BRDF) Measurements From Visible To Far Infrared (FIR)| Format | Member Price | Non-Member Price |
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Paper Abstract
A scattering instrument for making BRDF measurements is described. The instrument is microprocessor-controlled and is designed to obtain BRDF data at wavelengths of 0.6328, 1.15, 3.39, 10.6, 41.7, and eventually 118.8 microns.
Paper Details
Date Published: 3 March 1981
PDF: 7 pages
Proc. SPIE 0257, Radiation Scattering in Optical Systems, (3 March 1981); doi: 10.1117/12.959614
Published in SPIE Proceedings Vol. 0257:
Radiation Scattering in Optical Systems
Gary H. Hunt, Editor(s)
PDF: 7 pages
Proc. SPIE 0257, Radiation Scattering in Optical Systems, (3 March 1981); doi: 10.1117/12.959614
Show Author Affiliations
L D Brooks, University of Arizona (United States)
W. L. Wolfe, University of Arizona (United States)
Published in SPIE Proceedings Vol. 0257:
Radiation Scattering in Optical Systems
Gary H. Hunt, Editor(s)
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