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Proceedings Paper

Lockheed Sensor Test Facility
Author(s): J. R. Grammer; P. B. Forney
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Paper Abstract

The general design features of a new low-background infrared sensor test facility which is being installed at Lockheed Missiles & Space Company, Inc. are described. A brief description of the following is given: the facility layout, clean room facility, vacuum chamber, cryo shroud, cryo/vacuum system, optical system, optical control system, infrared sources, and sensors, overall system control and instrumentation.

Paper Details

Date Published: 23 December 1980
PDF: 7 pages
Proc. SPIE 0256, Infrared Systems, (23 December 1980); doi: 10.1117/12.959595
Show Author Affiliations
J. R. Grammer, Lockheed Missiles and Space Company, Incorporated (United States)
P. B. Forney, Lockheed Missiles and Space Company, Incorporated (United States)


Published in SPIE Proceedings Vol. 0256:
Infrared Systems
E. E. Sanmann, Editor(s)

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