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Proceedings Paper

Response Irregularities In Extrinsic Silicon Detectors
Author(s): Gene R. Ezell
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Paper Abstract

Extrinsic LWIR detectors exhibit departures from a "normal" linear response (irregularities). In the early 1970's, observations of these phenomena were inconsistent and unrepeatable, and the phenomena were not explainable by existing physical theory, so many observers labeled the phenomena "anomalous." Recent investigations into detector theory, processing, and application have shown repeatability and revealed apparent connections between various irregular aspects of detector response, and have indicated means of mitigating the irregularities' effects. Herein, extrinsic silicon detector irregularities generally recognized by the LWIR detector community are described with illustrations drawn from the literature. Pertinent discussions from the recent Extrinsic Detector Behavior Conference are summarized. The Army/Air Force program for mitigating the irregularity problem is outlined.

Paper Details

Date Published: 23 December 1980
PDF: 10 pages
Proc. SPIE 0256, Infrared Systems, (23 December 1980); doi: 10.1117/12.959591
Show Author Affiliations
Gene R. Ezell, Teledyne Brown Engineering (United States)


Published in SPIE Proceedings Vol. 0256:
Infrared Systems
E. E. Sanmann, Editor(s)

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