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Proceedings Paper

Infrared (IR) Calibration Measurement Requirements: Development From System Requirements
Author(s): Gregory R. McNeill; Hayden B. Macurda
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Paper Abstract

Applicable concepts in sampling statistics are introduced and applied to establish calibration measurement requirements based on sensor performance requirements and sensor measurement characteristics. The sampling statistics included allow the determination of the number of conditions and samples at each condition necessary to meet a specified uncertainty with a given confidence interval. The effect of correlation between parameters in sampling requirement reduction is treated. These analyses are then used to determine data processing loads, data storage requirements and facility operation time required to meet specified levels of system performance.

Paper Details

Date Published: 23 December 1980
PDF: 7 pages
Proc. SPIE 0256, Infrared Systems, (23 December 1980); doi: 10.1117/12.959588
Show Author Affiliations
Gregory R. McNeill, Nichols Research Corporation (United States)
Hayden B. Macurda, Nichols Research Corporation, (United States)

Published in SPIE Proceedings Vol. 0256:
Infrared Systems
E. E. Sanmann, Editor(s)

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