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Proceedings Paper

Design For An Automated Recognition System For Multilayer Circuit Board Testing
Author(s): Charles C.K Cheng
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Paper Abstract

An automated recognition system which utilizes a precision optical front-end, an electronic error-recog-nition system, an x-y table-positioning assembly and a printer was proposed, and a prototype model was constructed to prove its feasibility. The described system is capable of detecting line flaws and errors in conductor registration and in network characteristic impedance. The line-width information detected can be used both for impedance measurement and for detecting line flaws due to overwidth and underwidth conductors. Based upon performance, results show that the recognition system has good errordetecting resolution for all serious defects. It also provides a fast, reliable, practical method for measuring and testing printed wire width, thus solving a serious problem in manufacturing circuit boards for computer use.

Paper Details

Date Published: 19 November 1980
PDF: 7 pages
Proc. SPIE 0255, Practical Electro-Optical Instruments and Techniques, (19 November 1980); doi: 10.1117/12.959560
Show Author Affiliations
Charles C.K Cheng, Xerox Corporation (United States)


Published in SPIE Proceedings Vol. 0255:
Practical Electro-Optical Instruments and Techniques
Robert L. Kurtz, Editor(s)

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