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Proceedings Paper

10.6 Micron Wavelength Interferometry And The Measurement Of Infrared Transmitting Materials Index Of Refraction Homogeneity
Author(s): Charles E. Synborski; Mary J. Hanes
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Paper Abstract

Infrared optical systems, due primarily to military requirements, have made the transition from simple condenser optics which throw "heat" onto a discrete detector to diffraction limited imaging optics which are used to "view" in the infrared or illuminate high spatial resolution focal plane detector systems. Optically polished infrared lens element surfaces can be checked for sphericity and radius of curvature using conventional laser interferometry. However, the characterization of infrared material index of refraction homogeneity has been overlooked. To meet these newly emerging problems head on, Tropel developed TIRIS, the Tropel Infrared Interferometer System. The goal of this paper is to illustrate the importance of index inhomogeneity measurements by citing the degradation in performance (wavefront and Optical Transfer Function) of optical systems, caused by material inhomogeneities. A far infrared interferometer will be introduced, its basic construction outlined, and pertinent measurement parameters and formulas defined. Test results are shown of determining index inhomogeneity of two infrared transmitting samples.

Paper Details

Date Published: 19 November 1980
PDF: 8 pages
Proc. SPIE 0255, Practical Electro-Optical Instruments and Techniques, (19 November 1980); doi: 10.1117/12.959559
Show Author Affiliations
Charles E. Synborski, Coherent (United States)
Mary J. Hanes, Coherent (United States)

Published in SPIE Proceedings Vol. 0255:
Practical Electro-Optical Instruments and Techniques
Robert L. Kurtz, Editor(s)

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