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Proceedings Paper

Instrumentation For Measuring The Refractive Index Structure Constant
Author(s): Carl D Vought
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Paper Abstract

One of the measurable parameters of interest to experimenters who evaluate resolution characteristics of optical systems is the refractive index structure constant, C. During the last five years, several research programs have addressed the subject of measuring average values of Cn over paths of various lengths rather than performing point measurements with differential thermometers to determine C. These research programs have resulted in workable designs of instruments, but little has been done to evolve these designs into reliable and available commercial products. This paper relates the experiences involved in converting a well developed laboratory instrument into a configuration for use in the field.

Paper Details

Date Published: 19 November 1980
PDF: 3 pages
Proc. SPIE 0255, Practical Electro-Optical Instruments and Techniques, (19 November 1980); doi: 10.1117/12.959555
Show Author Affiliations
Carl D Vought, Lockheed-Huntsville Research & Engineering Center (United States)


Published in SPIE Proceedings Vol. 0255:
Practical Electro-Optical Instruments and Techniques
Robert L. Kurtz, Editor(s)

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