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Proceedings Paper

Routine Testing of Diamond-Turned Optics Using A 10.6 Micron Interferometer
Author(s): David C. Smith
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Paper Abstract

A variety of difficulties have been encountered while testing diamond turned optics with a standard HeNe interferometer. This is especially true in multiple-pass test configurations, where scattering and moire' effects create an ambiguity in interpretation of the interferogram, making slope error and finish determina-tion difficult if not impossible. In a production environment it is also desirable to speed inspection and "buy-off" by viewing the surface at the wavelength of use, namely in the 8-12 micron region. A 10.6 micron laser unequal path interferometer was designed and built to satisfy these needs. Zinc selenide optics are used throughout to facilitate alignment in the visible and allow expansion to near infrared wavelengths in the future. The output is displayed on a TV monitor through the use of a pyroelectric vidicon(PEV). Examples are given of standard interferometric tests in the IR as compared to visible interferograms, clearly showing the reduced effects of surface errors.

Paper Details

Date Published: 3 December 1980
PDF: 6 pages
Proc. SPIE 0246, Contemporary Infrared Sensors and Instruments, (3 December 1980); doi: 10.1117/12.959361
Show Author Affiliations
David C. Smith, Honeywell Electro-Optics Center (United States)

Published in SPIE Proceedings Vol. 0246:
Contemporary Infrared Sensors and Instruments
Herbert Kaplan; Frederic M. Zweibaum, Editor(s)

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