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Proceedings Paper

Status Of Cryogenic Refractive-Index Measurements
Author(s): William L. Wolfe; Arthur G. DeBell; James M. Palmer
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Paper Abstract

This review paper summarizes and identifies the sources of cryogenic refractive index measurements in the infrared. Representative refractive index versus temperature and wave-length data are presented for the following materials: germanium, silicon, hot-pressed cadmium telluride (Irtran 6), hot-pressed zinc sulfide (Irtran 2), polycrystalline cadmium telluride, cesium iodide, cesium bromide, zinc selenide, and birefringent thallium arsenic selenide. The measurement techniques and the errors associated with the measurements are discussed, and the need for additional measurements is delineated.

Paper Details

Date Published: 3 November 1980
PDF: 9 pages
Proc. SPIE 0245, Cryogenically Cooled Sensor Technology, (3 November 1980); doi: 10.1117/12.959348
Show Author Affiliations
William L. Wolfe, University of Arizona (United States)
Arthur G. DeBell, University of Arizona (United States)
James M. Palmer, University of Arizona (United States)

Published in SPIE Proceedings Vol. 0245:
Cryogenically Cooled Sensor Technology
Ronald J. Huppi, Editor(s)

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