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Proceedings Paper

Speckle Metrology For The Study Of Small Particles And Droplets
Author(s): C. M. Vest
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Paper Abstract

The speckle pattern formed when laser light is scattered by a large number of small spherical particles or droplets is investigated. Double-exposure speckle photography is used to measure the decrease of correlation which occurs when the angle of incidence of light on the scattering particles is changed by an amount a. Empirical equations relating to this loss of correlation to dimensionless groups involving the concentration, mean diameter and depth of the collection of scattering particles are given, and an analytical model which describes the basic phenomenon is presented.

Paper Details

Date Published: 3 December 1980
PDF: 9 pages
Proc. SPIE 0243, Applications of Speckle Phenomena, (3 December 1980); doi: 10.1117/12.959296
Show Author Affiliations
C. M. Vest, The University of Michigan (United States)

Published in SPIE Proceedings Vol. 0243:
Applications of Speckle Phenomena
William H. Carter, Editor(s)

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