Share Email Print
cover

Proceedings Paper

Radar And Optical Edge Measurements
Author(s): Robert Y. Wong
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Several pattern recognition methods have been used in scene matching. These methods include the use of intensity difference, edge measurements, invariant moments and symbolic descriptions as measurement features. This paper describes a method used in extracting edge measurements from radar and optical images for the purpose of scene matching.

Paper Details

Date Published: 23 December 1980
PDF: 3 pages
Proc. SPIE 0238, Image Processing for Missile Guidance, (23 December 1980); doi: 10.1117/12.959177
Show Author Affiliations
Robert Y. Wong, California State University (United States)


Published in SPIE Proceedings Vol. 0238:
Image Processing for Missile Guidance
Thomas F. Wiener, Editor(s)

© SPIE. Terms of Use
Back to Top