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Proceedings Paper

Compound Holographic Interference And Conventional Microscope And Its Application On Crystal Growth From Solution
Author(s): F. H. Mischgofsky
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Paper Abstract

A compound microscope is described which consists of a combination of a holographic interference microscope and a conventional microscope. Both systems can be optimized independently for fringe and image contrast, respectively. Both these systems proved to be indispensable for the description of complex phenomena, such as etch pit formation. On their own, they presented incomplete and even highly misleading information. The complete system combines i) the highly corrected image and long free working range of microscopy, with ii) the large vertical resolution and overall spatial information of interferometry and with iii) the increased depth of imaged volume and potentialities for time sequential observations of holography. The coherence of the light enables interference microscopy during crystal growth from a bulk solution. With the compound microscope the development of high index (or vicinal) faces, step bunches and etch pits were recorded during crystal growth and/or dissolution. Simultaneously also both concentration gradients and equiconcentration profiles surrounding the growing (or dissolving) crystal were made visible. Microinterferograms were obtained from i) interference of the reconstructed image (crystal, solution or free space) of a single exposure hologram with a real object beam; from ii) the superposed reconstructions of two such holograms; and from iii) the reconstruction of double exposure holograms (time sequential). The applicability of the various techniques is discussed with respect to the study of crystal growth processes.

Paper Details

Date Published: 15 May 1981
PDF: 9 pages
Proc. SPIE 0236, 1980 European Conf on Optical Systems and Applications, (15 May 1981); doi: 10.1117/12.958991
Show Author Affiliations
F. H. Mischgofsky, Delft University of Technology (The Netherlands)

Published in SPIE Proceedings Vol. 0236:
1980 European Conf on Optical Systems and Applications
D. J. Kroon, Editor(s)

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