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Proceedings Paper

Charge Transfer Radiography Using Cadmium Sulfide
Author(s): Ivor Brodie; Robert A. Gutcheck; John B. Mooney
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Paper Abstract

Electroradiographic methods offer a possible alternative to conventional silver halide x-ray film/screen combinations in terms of lower-cost x-ray radiographs and more rapid development techniques. In charge transfer radiography (CTR), a semiconductor solid material exploits a photoconductive mechanism to transfer a latent electrostatic image onto a dielectric surface. The latent electrostatic image is made visible by xerographic toning. The work reported here used a sintered CdS photoconductive layer to produce large-area image receptors for CTR. Measurements of the currents generated by the incident x-ray flux show that, unlike the case for optical radiation, copper/chlorine dopants do not significantly alter the sample sensitivities. However, the sensitivity of materials thus doped is affected by crystal size and binder material. Remarkably, the sensitivity is not strongly dependent on the thickness of the photoconductor. The charge generation energy is shown to be related to the inverse of the applied electric field for both Se and CdS. An empirical expression is derived from the data that relates the exposure to the surface charge available for transference to the dielectric. Examples of paper radiographs are given, and an exposure characteristic curve for the CdS shows that the sensitivity of the sintered CdS plate is similar to normal x-ray films, but less than that of film/screen combinations.

Paper Details

Date Published: 18 August 1980
PDF: 10 pages
Proc. SPIE 0233, Application of Optical Instrumentation in Medicine VIII, (18 August 1980); doi: 10.1117/12.958906
Show Author Affiliations
Ivor Brodie, SRI International (United States)
Robert A. Gutcheck, SRI International (United States)
John B. Mooney, SRI International (United States)

Published in SPIE Proceedings Vol. 0233:
Application of Optical Instrumentation in Medicine VIII
Joel E. Gray; William R. Hendee; Andrew G. Haus; William S. Properzio, Editor(s)

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