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Proceedings Paper

Optical Based,Microprocessor Controlled, Stack Particulate Monitor
Author(s): A. L. Wertheimer; G. J. Pfisterer
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Paper Abstract

An instrument has been constructed for real time measurement of particle size in the range of 0.2 to 20 microns in diameter. This unit is designed for use in industrial stationary sources, and employs a helium neon laser source and two modes of light scattering, low angle forward scattering and polarization dependent, 90° scattering. A Z80 micro-processor provides control of the measurement functions. These include control of the synchronization and multiplexing of eight separate detectors, computation of a particle size histogram from the raw data, and control of the data printout through an alpha-numeric printer.

Paper Details

Date Published: 8 August 1980
PDF: 8 pages
Proc. SPIE 0230, Minicomputers and Microprocessors in Optical Systems, (8 August 1980); doi: 10.1117/12.958820
Show Author Affiliations
A. L. Wertheimer, Leeds and Northrup Company (United States)
G. J. Pfisterer, Leeds and Northrup Company (United States)

Published in SPIE Proceedings Vol. 0230:
Minicomputers and Microprocessors in Optical Systems
Chris L. Koliopoulos; Frederic M. Zweibaum, Editor(s)

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